Research Paper
Year: 2022 | Month: November | Volume: 9 | Issue: 11 | Pages: 54-59
DOI: https://doi.org/10.52403/ijrr.20221108
I2C Master Scan Chain Insertion and Functional Coverage
Nagendra Prasad N1, Dr. Kiran V2
1,2Department of Electronics and Communication, R.V College of Engineering, VTU University, Bangalore, India
Corresponding Author: Nagendra Prasad N
ABSTRACT
I2C is a serial, bidirectional bus for communication that Philips Semiconductors created. only two bus lines are needed a (SDA) serial data line and a (SCL) serial clock line. With the addition of scan chains, a method for I2C Bus testing has been implemented in this study. In order to achieve the necessary requirements, the number of scan chain insertions is predetermined. The coverage of the Functions is also performed to verify the test bench.
Keywords: I2C, Scan Chain, Coverage, Testing, Design for test
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